Sinji Onga
1Patents
1h-index
6Co-inventors
25Inventor score
Filing activity: May 3, 2000 → May 3, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6514885B1 | Semiconductor device manufacturing method to reduce process induced stress and crystalline defects | Electricity | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.