Inventor · Rodgau, DE

Stephan Weiß

1Patents
0h-index
3Co-inventors
19Inventor score

Filing activity: May 23, 2024 → May 23, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US12264914B2 Device and method for measuring wafers Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.