Steve Scranton
2Patents
1h-index
6Co-inventors
30Inventor score
Filing activity: Feb 20, 2018 → Apr 8, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10254214B1 | Systems, devices, and methods for combined wafer and photomask inspection | Electricity | 3 | Active |
| US11125677B2 | Systems, devices, and methods for combined wafer and photomask inspection | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.