Steven Biellak
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: Jul 10, 2002 → Jul 10, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6922236B2 | Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection | Physics | 15 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.