Steven Kim
2Patents
1h-index
9Co-inventors
27Inventor score
Filing activity: Nov 19, 2012 → Mar 8, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9274070B2 | System and process for measuring strain in materials at high spatial resolution | Electricity | 2 | Active |
| US9406496B2 | Method and system for improving characteristic peak signals in analytical electron microscopy | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.