Takehiro Ohnishi
6Patents
4h-index
22Co-inventors
57Inventor score
Filing activity: Jul 10, 1998 → Nov 7, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6867123B2 | Semiconductor integrated circuit device and its manufacturing method | Electricity | 59 | Expired |
| US6307269A | Semiconductor device with chip size package | Electricity | 25 | Expired |
| US7091620B2 | Semiconductor device and manufacturing method thereof | Electricity | 8 | Expired |
| US6515371B2 | Semiconductor device with elastic structure and wiring | Electricity | 7 | Expired |
| US11156724B2 | System and method for calibrating inter-frequency hardware bias in RTK positioning using error correction information | Physics | 3 | Active |
| US6639323B2 | Semiconductor device and its manufacturing method | Electricity | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.