Tanya Yang
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: Aug 7, 2009 → Aug 7, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8339449B2 | Defect monitoring in semiconductor device fabrication | Physics | 83 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.