Teng Lin
2Patents
1h-index
3Co-inventors
30Inventor score
Filing activity: Apr 26, 2013 → Apr 13, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9383409B2 | Method of diagnosable scan chain | Physics | 4 | Active |
| US9562945B2 | Modifying a scan chain for improved fault diagnosis of integrated circuits | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.