Teodor Gotszalk
2Patents
2h-index
10Co-inventors
31Inventor score
Filing activity: May 2, 2008 → Jun 26, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8056402B2 | Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques | Physics | 13 | Active |
| US8689359B2 | Apparatus and method for investigating surface properties of different materials | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.