Apparatus and method for investigating surface properties of different materials

US8689359B2 · kind B2 · utility

Assignee

• Nano Analytik GMBH · DE

Inventors

• Ivo Rangelow · Kirchbauna, DE
• Tzvetan Ivanov · Oehrenstock, DE
• Burkhard Volland · Erfurt, DE
• Teodor Gotszalk · Wrocław, PL
• Miroslaw Woszczyna · Wrocław, PL
• Jerzy Mielczarski · Houdemont, FR
• Yanko Sarov · Aalen, DE

Key dates

• Filing date: Jun 26, 2008
• Grant date: Apr 1, 2014
• Expiry date: Sep 28, 2030

Classification

• Technology area (CPC G): Physics
• CPC primary: G01Q70/12
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present invention relates to an apparatus and a method for investigating surface properties of different materials, which make it possible to carry out atomic force microscopy with a simplified and faster shear force method. The apparatus according to the invention is characterized by perpendicular orientation of the measuring tip of a self-actuated cantilever with respect to the surface of the sample. A piezoresistive sensor and a bimorph actuator are preferably DC-isolated. The measuring tip is in the form of a carbon nanotube, in particular. A plurality of cantilevers can be arranged in the form of a cantilever array which is characterized by a comb-like arrangement of individual pre-bent cantilevers. The method according to the invention is distinguished by a fast feedback signal on account of the distance between the measuring tip and the surface to be investigated being regulated using the change in a DC signal which supplies the actuator.