Thomas Brozek
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Aug 28, 2015 → Aug 28, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9691669B1 | Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.