Inventor · Cincinnati, OH, US

Thomas E. Bantel

8Patents
7h-index
12Co-inventors
60Inventor score

Filing activity: Sep 20, 1984 → Mar 31, 2008

Most-cited inventions

PatentTitleAreaCited byStatus
US5111048A Apparatus and method for detecting fatigue cracks using infrared thermography Physics 50 Expired
US5111046A Apparatus and method for inspecting cooling holes Physics 41 Expired
US4644162A Cooling hole inspection Physics 35 Expired
US4818118A Coating thickness measurement Physics 23 Expired
US4634291A Coating thickness measurement Physics 21 Expired
US7266174B2 Radiographic inspection of airframes and other large objects Physics 8 Expired
US5703362A Method for nondestructive/noncontact detection and quantification of alpha case on a surface of a workpiece made of titanium or a titanium-based alloy Physics 8 Expired
US8393784B2 Characterization of flaws in composites identified by thermography Physics 6 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.