Apparatus and method for detecting fatigue cracks using infrared thermography
US5111048A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 27, 1990 |
| Grant date | May 5, 1992 |
| Priority date | — |
| Expiry date | Sep 27, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/72
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for detecting a defect in a workpiece are disclosed. The workpiece is positioned with a surface of the workpiece to be inspected in an optical path of an infrared radiation detector. A selected portion of the workpiece is heated by scanning with electromagnetic radiation for a selected duration to cause an increase in radiance from any defect present in the selected portion. Any defects, present in the workpiece selected portion, which may cause a failure of the workpiece, may be detected and distinguished from minor surface anomalies by analyzing a transient response of the irradiance received by the infrared radiation detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.