Thomas Grebner
3Patents
2h-index
3Co-inventors
30Inventor score
Filing activity: Jul 1, 2002 → Nov 28, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6897646B2 | Method for testing wafers to be tested and calibration apparatus | Physics | 8 | Expired |
| US6882139B2 | Electronic component, tester device and method for calibrating a tester device | Physics | 6 | Expired |
| US7870447B2 | Method and system for carrying out a process on an integrated circuit | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.