Thomas Vogels
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Nov 26, 2003 → Nov 26, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7325180B2 | System and method to test integrated circuits on a wafer | Physics | 9 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.