Inventor · Palo Cedro, CA, US

Timothy Harns

2Patents
2h-index
2Co-inventors
30Inventor score

Filing activity: Jul 15, 1981 → Mar 19, 1987

Most-cited inventions

PatentTitleAreaCited byStatus
US4795977A Interface system for interfacing a device tester to a device under test Physics 56 Expired
US4460997A Memory tester having memory repair analysis capability Physics 36 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.