Todd A. Cerni
10Patents
10h-index
6Co-inventors
65Inventor score
Filing activity: Jan 24, 1975 → Nov 15, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6903818B2 | Low noise intracavity laser particle counter | Physics | 80 | Expired |
| US6246474A | Method and apparatus for measurement of particle size distribution in substantially opaque slurries | Human Necessities | 68 | Expired |
| US6275290A | Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems | Human Necessities | 63 | Expired |
| US7456960B2 | Particle counter with improved image sensor array | Physics | 61 | Expired |
| US7030980B1 | Diode pumped intracavity laser particle counter with improved reliability and reduced noise | Physics | 58 | Expired |
| US6709311B2 | Spectroscopic measurement of the chemical constituents of a CMP slurry | Physics | 53 | Expired |
| US7088446B2 | Optical measurement of the chemical constituents of an opaque slurry | Physics | 48 | Expired |
| USRE39783E1 | Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems | General | 43 | Expired |
| US4874572A | Method of and apparatus for measuring vapor density | Emerging Cross-Sectional Technologies | 16 | Expired |
| US3973258A | Transient event data acquisition apparatus for use with radar systems and the like | Physics | 15 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.