Patent · US Expired

Diode pumped intracavity laser particle counter with improved reliability and reduced noise

US7030980B1 · kind B1 · utility

58Cited by
9References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 29, 2004
Grant dateApr 18, 2006
Priority date
Expiry dateDec 29, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2015/1486
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A fluid particle counter comprising an intracavity diode pumped solid state laser having a solid state lasing material having a non-reflective coating and a concave mirror having a reflective coating, with the coatings isolated from the sample flow by Brewster windows. The laser beam is apertured by an aperture assembly including an inner aperture closest to the inlet nozzle assembly and an outer aperture farther from the inlet nozzle assembly, with the outer aperture significantly farther from the inner aperture than the inner aperture is from the inlet nozzle assembly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.