Tom Leviant
3Patents
1h-index
28Co-inventors
40Inventor score
Filing activity: Jun 30, 2016 → Feb 18, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10831108B2 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Electricity | 2 | Active |
| US11360397B2 | System and method for application of harmonic detectivity as a quality indicator for imaging-based overlay measurements | Physics | 0 | Active |
| US11862522B2 | Accuracy improvements in optical metrology | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.