Tom Moebert
1Patents
0h-index
3Co-inventors
19Inventor score
Filing activity: Jun 26, 2020 → Jun 26, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11631168B2 | Method, computer program and apparatus for determining a quality of a mask of a photolithography apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.