Tomoya Niho
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Apr 13, 1999 → Apr 13, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6498992B1 | Defect diagnosis method and defect diagnosis apparatus | Physics | 13 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.