Defect diagnosis method and defect diagnosis apparatus
US6498992B1 · kind B1 · utility
13Cited by
4References
8Claims
0Family size
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Key dates
| Filing date | Apr 13, 1999 |
| Grant date | Dec 24, 2002 |
| Priority date | — |
| Expiry date | Apr 13, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M13/028
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for diagnosis of a defect of an object to be inspected, such as a rotational machine, etc., by measuring a vibration generated thereby, wherein a measured signal generated by the object is detected, an amplitude probability density function of wave-form of the obtained measured signal is expanded orthogonally through a Gram-Charlier series, and the Gram-Charlier series are calculated so as to make diagnosis of defect(s) in the object to be inspected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.