Torsten Borchers
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Apr 9, 2002 → Apr 9, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6815959B2 | Systems and methods for measuring properties of conductive layers | Physics | 12 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.