Travis E. Swanson
7Patents
2h-index
5Co-inventors
40Inventor score
Filing activity: Aug 30, 2001 → Jul 22, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7444559B2 | Generation of memory test patterns for DLL calibration | Physics | 14 | Expired |
| US7694202B2 | Providing memory test patterns for DLL calibration | Physics | 7 | Active |
| US7058778B2 | Memory controllers having pins with selectable functionality | Physics | 2 | Expired |
| US6798264B2 | Methods and apparatus for signal processing | Electricity | 1 | Expired |
| US8472279B2 | Channel skewing | Emerging Cross-Sectional Technologies | 1 | Active |
| US9105324B2 | Channel skewing | Emerging Cross-Sectional Technologies | 1 | Active |
| US9542985B2 | Channel skewing | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.