Tsung-Jun Lee
3Patents
1h-index
2Co-inventors
27Inventor score
Filing activity: Sep 3, 2014 → Apr 13, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9435863B2 | Integrated circuit testing interface on automatic test equipment | Physics | 2 | Active |
| US9506974B2 | Active probe card | Physics | 0 | Active |
| US9952277B2 | Test device and method using single probe to test multiple pads of chip | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.