Ulich Diebold
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: Aug 20, 1993 → Aug 20, 1993
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5485473A | Method and system for testing an integrated circuit featuring scan design | Physics | 19 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.