Uri Lev
2Patents
1h-index
7Co-inventors
30Inventor score
Filing activity: Jul 9, 2015 → Apr 17, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10347462B2 | Imaging of crystalline defects | Electricity | 1 | Active |
| US10541104B2 | System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.