Uwe Schmidt
13Patents
8h-index
18Co-inventors
65Inventor score
Filing activity: Feb 7, 1997 → Dec 22, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6432545B1 | Glazing provided with a low-emissivity multilayer stack | Chemistry; Metallurgy | 57 | Expired |
| US6783876B2 | Layer stack for transparent substrates | Emerging Cross-Sectional Technologies | 44 | Expired |
| US6541133B1 | Layered stack for transparent substrates | Emerging Cross-Sectional Technologies | 39 | Expired |
| US6306525A | Transparent substrate provided with thin layers having reflection properties in the infrared | Emerging Cross-Sectional Technologies | 37 | Expired |
| US6159621A | Glass substrate provided with a thin-film stack having reflective properties in the infrared and/or in the region of solar radiation | Emerging Cross-Sectional Technologies | 33 | Expired |
| US6020077A | Transparent substrate provided with a thin-film stack with properties in the infrared | Emerging Cross-Sectional Technologies | 16 | Expired |
| US7858193B2 | Low emissivity (low-E) thin coating stacks with intermediate antidiffusion layers | Emerging Cross-Sectional Technologies | 15 | Active |
| US7211328B2 | Prestressable low-E layer systems for window panes | Chemistry; Metallurgy | 13 | Expired |
| US8043707B2 | Highly heat-resistant low-emissivity multilayer system for transparent substrates | Emerging Cross-Sectional Technologies | 5 | Active |
| US7573634B2 | Micromechanical mirrors with a high-reflection coating, method for production thereof and use thereof | Physics | 5 | Expired |
| US7153595B2 | Transparent substrate having a stack of thin metallic reflection layers | Emerging Cross-Sectional Technologies | 4 | Expired |
| US7074485B2 | Prestressable layer system for partition glass | Chemistry; Metallurgy | 1 | Expired |
| US10737974B2 | Glazing comprising a carbon-based upper protective layer | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.