Vaskar Sarkar
3Patents
1h-index
5Co-inventors
33Inventor score
Filing activity: Feb 16, 2017 → Feb 28, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10460821B2 | Area efficient parallel test data path for embedded memories | Physics | 1 | Active |
| US9899103B2 | Area efficient parallel test data path for embedded memories | Physics | 0 | Active |
| US12130329B2 | Methods and apparatus to implement a boundary scan for shared analog and digital pins | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.