Vincent Gizzo
3Patents
1h-index
6Co-inventors
30Inventor score
Filing activity: Nov 20, 2014 → Apr 29, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9875947B2 | Method of surface profile correction using gas cluster ion beam | Electricity | 1 | Active |
| US9502209B2 | Multi-step location specific process for substrate edge profile correction for GCIB system | Electricity | 0 | Active |
| US9105443B2 | Multi-step location specific process for substrate edge profile correction for GCIB system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.