Vivekanand Kini
3Patents
2h-index
16Co-inventors
41Inventor score
Filing activity: Sep 30, 2004 → Feb 8, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7142992B1 | Flexible hybrid defect classification for semiconductor manufacturing | Physics | 16 | Expired |
| US9257260B2 | Method and system for adaptively scanning a sample during electron beam inspection | Electricity | 2 | Active |
| US9734987B2 | Method and system for adaptively scanning a sample during electron beam inspection | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.