Wan S. Wong
4Patents
4h-index
11Co-inventors
43Inventor score
Filing activity: Feb 16, 1996 → Mar 6, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6292582A | Method and system for identifying defects in a semiconductor | Electricity | 144 | Expired |
| US6246787A | System and method for knowledgebase generation and management | Electricity | 108 | Expired |
| US6483938B1 | System and method for classifying an anomaly | Electricity | 107 | Expired |
| US5696835A | Apparatus and method for aligning and measuring misregistration | Physics | 73 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.