Warren Lin
16Patents
14h-index
9Co-inventors
67Inventor score
Filing activity: Mar 14, 1988 → Apr 8, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5872633A | Methods and apparatus for detecting removal of thin film layers during planarization | Electricity | 212 | Expired |
| US5961369A | Methods for the in-process detection of workpieces with a monochromatic light source | Physics | 55 | Expired |
| US6750974B2 | Method and system for 3D imaging of target regions | Physics | 52 | Expired |
| US4826321A | Thin dielectric film measuring system | Physics | 47 | Expired |
| US5733171A | Apparatus for the in-process detection of workpieces in a CMP environment | Physics | 46 | Expired |
| US6249347A | Method and system for high speed measuring of microscopic targets | Physics | 34 | Expired |
| US7219777B2 | Reinforced brake rotor | Mechanical Engineering; Lighting; Heating | 30 | Expired |
| US6366357B1 | Method and system for high speed measuring of microscopic targets | Physics | 29 | Expired |
| US7097007B2 | Vented slot brake rotor | Mechanical Engineering; Lighting; Heating | 25 | Expired |
| US6177998A | Method and system for high speed measuring of microscopic targets | Physics | 23 | Expired |
| US5823853A | Apparatus for the in-process detection of workpieces with a monochromatic light source | Physics | 23 | Expired |
| US6181425A | Method and system for high speed measuring of microscopic targets | Physics | 17 | Expired |
| US5993289A | Methods for the in-process detection of workpieces in a CMP environment | Physics | 16 | Expired |
| US7568560B2 | Center mount two piece brake rotor | Mechanical Engineering; Lighting; Heating | 14 | Expired |
| US7199882B2 | Method and system for high speed measuring of microscopic targets | Physics | 14 | Expired |
| US5164857A | Wide band non-coated beam splitter | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.