Wayne A. Branagh
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: May 25, 1999 → May 25, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6381008B1 | Method and system for identifying etch end points in semiconductor circuit fabrication | Physics | 61 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.