Wayne Kevin Beebe
2Patents
2h-index
7Co-inventors
30Inventor score
Filing activity: Dec 12, 1995 → Oct 28, 1998
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5867507A | Testable programmable gate array and associated LSSD/deterministic test methodology | Physics | 92 | Expired |
| US6021513A | Testable programmable gate array and associated LSSD/deterministic test methodology | Physics | 43 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.