Testable programmable gate array and associated LSSD/deterministic test methodology

US5867507A · kind A · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Wayne Kevin Beebe · South Burlington, US
• Sally Botala · Colchester, US
• Scott Whitney Gould · South Burlington, US
• Frank Ray Keyser III · Colchester, US
• Wendell Ray Larsen · South Burlington, US
• Ronald Raymond Palmer · Colchester, US
• Brian Worth · Jericho, US

Key dates

• Filing date: Dec 12, 1995
• Grant date: Feb 2, 1999
• Expiry date: Dec 12, 2015

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/318558
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A programmable gate array includes test subsystems for testing various functional subsystems of the programmable gate array. A sequence of test methods, employing the test subsystems, test the functionality of the programmable gate array, taking into account the interdependencies of the various subsystems and accordingly enabling fault isolation therein.