Weihao Wan
5Patents
1h-index
20Co-inventors
40Inventor score
Filing activity: Dec 26, 2018 → Jan 27, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11927511B2 | Method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy | Physics | 1 | Active |
| US11506650B2 | Method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials | Physics | 0 | Active |
| US12019025B2 | Apparatus and method for preparing glow discharge sputtering samples for material microscopic characterization | Electricity | 0 | Active |
| US10804073B2 | Apparatus and method for large-scale high throughput quantitative characterization and three-dimensional reconstruction of material structure | Electricity | 0 | Active |
| US10895521B2 | Full-view-field quantitative statistical distribution characterization method of precipitate particles in metal material | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.