Method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy
US11927511B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 27, 2022 |
| Grant date | Mar 12, 2024 |
| Priority date | — |
| Expiry date | Oct 30, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/2893
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present application relates to a method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy, and relates to the technical field of analysis of metal material composition and microstructure, comprising the following steps: step 1, processing a to-be-tested sample and determining a calibration coefficient; step 2, obtaining a two-dimensional element content distribution map of the to-be-tested sample; and step 3, determining the number and average spacing of primary dendrites. A composition distribution region analyzed in the present application is larger than the area of a distribution region of the traditional microscopic analysis method, and the sample preparation is simple. The distribution, number and average spacing of the primary dendrites can be obtained without metallographic corrosion sampling. Therefore, the present invention has the advantages of large statistical field of view, high efficiency and complete information, and the statistical data is more accurate and reliable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.