Inventor · Saitama, JP

Weimin Lin

2Patents
2h-index
7Co-inventors
27Inventor score

Filing activity: Sep 8, 2006 → Dec 4, 2006

Most-cited inventions

PatentTitleAreaCited byStatus
US7685733B2 Micro force measurement device, micro force measurement method, and micro surface shape measurement probe Physics 14 Active
US8500988B2 Device and method for ELID honing Performing Operations; Transporting 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.