Weiqiang Sun
8Patents
1h-index
16Co-inventors
40Inventor score
Filing activity: May 26, 2016 → Jan 27, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10347460B2 | Patterned substrate imaging using multiple electron beams | Electricity | 4 | Active |
| US11295928B2 | Multi-pole deflector for charged particle beam and charged particle beam imaging apparatus | Electricity | 1 | Active |
| US11239044B2 | Wien filter and charged particle beam imaging apparatus | Electricity | 1 | Active |
| US10134560B2 | Multi-stage/multi-chamber electron-beam inspection system | Electricity | 1 | Active |
| US11908657B2 | Scanning electron microscope device and electron beam inspection apparatus | Electricity | 0 | Active |
| US11084118B2 | Method and system of all-position plasma welding process for titanium alloy pipeline | Performing Operations; Transporting | 0 | Active |
| US11908658B2 | Scanning electron microscope device and electron beam inspection apparatus | Electricity | 0 | Active |
| US11756761B2 | Wien filter and charged particle beam imaging apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.