Wen Li
3Patents
2h-index
12Co-inventors
41Inventor score
Filing activity: Dec 16, 2004 → Mar 11, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7137055B2 | Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory | Physics | 19 | Expired |
| US9026969B2 | Method of designing arrangement of TSV in stacked semiconductor device and designing system for arrangement of TSV in stacked semiconductor device | Physics | 3 | Active |
| US8385627B2 | Method and apparatus for inspecting defects of semiconductor device | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.