Willi Steegmuller
3Patents
2h-index
3Co-inventors
30Inventor score
Filing activity: Aug 24, 1979 → Feb 5, 1981
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4406948A | Device for measuring thin films by means of beta radiation | Physics | 7 | Expired |
| US4293767A | Apparatus for measuring the thickness of thin layers | Physics | 7 | Expired |
| US4401518A | Method of measuring thickness of a tin layer and thickness measuring device therefor | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.