Device for measuring thin films by means of beta radiation
US4406948A · kind A · utility
Inventors
Key dates
| Filing date | Oct 14, 1980 |
| Grant date | Sep 27, 1983 |
| Priority date | — |
| Expiry date | Oct 14, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A tube arrangement has a first partial tube and a second partial tube, and one fine adjustment arrangement for coaxially displacing the partial tubes with respect to one another. The partial tubes, an aperture ring with a small aperture opening, a beta radiator point source and a GM-counter are coaxially arranged. The partial tubes are connected each with one or two of the following: an aperture ring, the beta radiator point source, and the GM-counter. A blocking means blocks the fine adjustment arrangement. One of the partial tubes is connected galvanically conducting with the GM-counter anode and the other partial tubes are connected galvanically conducting with the GM-counter cathode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.