Patent · US Expired

Device for measuring thin films by means of beta radiation

US4406948A · kind A · utility

7Cited by
3References
16Claims
0Family size

Inventors

Key dates

Filing dateOct 14, 1980
Grant dateSep 27, 1983
Priority date
Expiry dateOct 14, 2000

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B15/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A tube arrangement has a first partial tube and a second partial tube, and one fine adjustment arrangement for coaxially displacing the partial tubes with respect to one another. The partial tubes, an aperture ring with a small aperture opening, a beta radiator point source and a GM-counter are coaxially arranged. The partial tubes are connected each with one or two of the following: an aperture ring, the beta radiator point source, and the GM-counter. A blocking means blocks the fine adjustment arrangement. One of the partial tubes is connected galvanically conducting with the GM-counter anode and the other partial tubes are connected galvanically conducting with the GM-counter cathode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.