William D. Jimenez
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: May 31, 2000 → May 31, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6490032B1 | Method and apparatus for improving a dark field inspection environment | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.