Wu Y. Han
2Patents
0h-index
4Co-inventors
21Inventor score
Filing activity: Mar 22, 2018 → Mar 22, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10553504B2 | Inspection of substrates | Physics | 0 | Active |
| US10466179B2 | Semiconductor device inspection of metallic discontinuities | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.