Xiaoye Ding
5Patents
1h-index
2Co-inventors
30Inventor score
Filing activity: Jun 24, 2020 → Nov 2, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11243067B2 | Systems and methods for semiconductor chip surface topography metrology | Physics | 4 | Active |
| US11796307B2 | Systems and methods for semiconductor chip surface topography metrology | Physics | 0 | Active |
| US11454491B2 | Systems having light source with extended spectrum for semiconductor chip surface topography metrology | Physics | 0 | Active |
| US11448499B2 | Systems and methods for semiconductor chip surface topography metrology | Physics | 0 | Active |
| US11562919B2 | Systems and methods for semiconductor chip surface topography metrology | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.