Xiuwei Tian
1Patents
0h-index
8Co-inventors
19Inventor score
Filing activity: Dec 29, 2018 → Dec 29, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11340286B2 | On-wafer S-parameter calibration method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.