Yan Cing Lin
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Oct 30, 2017 → Oct 30, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10325796B2 | Apparatus and system for detecting wafer damage | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.