Inventor · Beijing, CN

Yefa Li

1Patents
0h-index
4Co-inventors
19Inventor score

Filing activity: Jul 28, 2015 → Jul 28, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US9778024B2 Target material thickness measuring apparatus Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.