Inventor · Gongguan, TW

Yi-Ping Peng

1Patents
0h-index
4Co-inventors
19Inventor score

Filing activity: Sep 27, 2012 → Sep 27, 2012

Most-cited inventions

PatentTitleAreaCited byStatus
US9110125B2 Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor device Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.